Title: Electron Probe MicroAnalysis CAMECA SXFive TACTIS and Materials Applications
Speaker: Mona Moret, AMETEK CAMECA
Time：AM 9:30, Dec. 7th（12月7日上午9:30）
Address：Room 202, Building #1，State Key Laboratory of silicon Materials（硅材料國家重點實驗室1號樓2樓202 )
Mona Pierrette MORET：
Mona Pierrette has been working for CAMECA for 11 years. She started as a product manager, addressing analytical development for the CAMECA’s metrology EPMA system used in the semiconductor industry. The applications were in the measurement of composition and thickness of thin layer. Since 2014 Mona is in sales as Worldwide EPMA sales leader, supporting all the sales of SX EPMA.
Mona has an international scientific background with a Master of Science in Physics in the United States and PhD in physics and materials science in the Netherlands. She worked at ESRF synchrotron, Volvo Aero, and NXP. The worked carried out was on thin films / ceramics development and characterization, optical and X-ray characterization. She completed her scientific education with a sales and marketing Mastère from HEC Paris.
