授課時(shí)間：4月8號(hào)-10號(hào)（其中8.9號(hào)全天，10號(hào)上午）
地 點(diǎn)：教十一517教室（根據(jù)參與人數(shù)，有可能會(huì)調(diào)整至教十一318會(huì)議室）
Spring lecture on advanced electron microscopy, particularly on STEM.
Nobuo Tanaka, Ph.D
Designated professor of institute of materials and systems for sustainability (IMaSS)
of Nagoya University, and the former president of Japanese Society of Microscopy(JSM)
April 8 (Mon.) Room 318, #11 Teaching Bld.
10:00 - 12:00 Introduction to TEM (see Chap. 1,2, 3)
Recent interesting data of STEM, including DPC-STEM
What is STEM? (Chap. 9)
13:30-15:00 Image contrast of STEM (Chap. 11)
15:15-16:30 Image contrast of STEM 2 and aberration correction for STEM(Chap.
11, 8.4 & Appendix 18)
April 9(Tues.) Room 318, #11 Teaching Bld.
9:30-12:00 Basics of Fourier transform (Appendix 15)
Imaging theory of STEM (Chap. 12)
Cowley's theory of high-resolution STEM (Appendix 19)
13:30-15:00 Multislice theory for STEM imaging (Chap. 12) and introduction of
differential phase contrast STEM (Chap. 10.2)
15:15-16:30 Theory of DPC, center of mass (COM)-STEM, and integrated DPC-STEM
(new PPT)
April 10 (Wed.) Room 318, #11 Teaching Bld.
9:30-11:00 On Z-contrast of a single atom in STEM image (new PPT).
Close the lecture after Q & A.
#Students could be requested to refer, in advance, "Electron nano-imaging" by the
present lecturer (Springer,2017) by using the electronic version downloaded from
Zhejiang University e-book library.
